Chapter

Ultrafast Phenomena XV

Volume 88 of the series Springer Series in Chemical Physics pp 42-44

Ultrafast Extreme Ultraviolet Holography: Dynamic Monitoring of Surface Deformation

  • Ra’anan I. TobeyAffiliated withDepartment of Physics and JILA, University of Colorado
  • , Mark E. SiemensAffiliated withDepartment of Physics and JILA, University of Colorado
  • , Oren CohenAffiliated withDepartment of Physics and JILA, University of Colorado
  • , Qing LiAffiliated withDepartment of Physics and JILA, University of Colorado
  • , Margaret M. MurnaneAffiliated withDepartment of Physics and JILA, University of Colorado
  • , Henry C. KapteynAffiliated withDepartment of Physics and JILA, University of Colorado
  • , Keith A. NelsonAffiliated withDepartment of Chemistry, Massachusetts Institute of Technology

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Abstract

We extend the use of Gabor Holography with Extreme Ultraviolet (EUV) Radiation to study surface deformations on ultrafast timescales. The use of EUV light allows for surface sensitive probing with sub-Angstrom displacement resolution and sub-100fs time resolution.