Date: 02 Jun 2005

A model based method for characterization and location of curved image features

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Abstract

This paper deals with the development of a parametric model based method to locate and characterize accurately important curved features such as ellipses and B-splines based curves. The method uses all the grey level information of the pixels contained within a window around the feature of interest and produces a complete parametric model that best approximates in a mean-square sense the observed grey level image intensities within the working area. Promising experimental results have been obtained on real data.