Design of Systems on a Chip: Design and Test

pp 211-222

Testable Design and Testing of Microsystems

  • Hans G. KerkhoffAffiliated withMESA+ Research Institute/University of Twente, Testable Design & Testing of Microsystems Group

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The low internal node accessibility of microsystems and the variety of components and technologies used in these systems can be considered as a real challenge for testing these devices. Although many concepts can be applied which have already been developed for testing boards and ICs, also new aspects like sensor/actuator testing have to be considered. The choice which of the many approaches is most adequate turns out to be very application dependent. Test approaches are shown for two microsystems


Design-for-Test Testing BIST Test Busses Boundary-Scan Sensor/Actuator Testing Microsystems MCMs