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Ultrafast Extreme Ultraviolet Holography: Dynamic Monitoring of Surface Deformation

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Ultrafast Phenomena XV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 88))

Abstract

We extend the use of Gabor Holography with Extreme Ultraviolet (EUV) Radiation to study surface deformations on ultrafast timescales. The use of EUV light allows for surface sensitive probing with sub-Angstrom displacement resolution and sub-100fs time resolution.

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References

  1. V.V. Tenemov, et. al., Applied Physics A 78: 483–489 (2004).

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  2. D.J. Funk, et. al., Applied Physics A 81: 295–302 (2005).

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Author information

Authors and Affiliations

  1. Department of Physics and JILA, University of Colorado, Boulder, Colorado

    Ra’anan I. Tobey, Mark E. Siemens, Oren Cohen, Qing Li, Margaret M. Murnane & Henry C. Kapteyn

  2. Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts

    Keith A. Nelson

Authors
  1. Ra’anan I. Tobey
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  2. Mark E. Siemens
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  3. Oren Cohen
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  4. Qing Li
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  5. Margaret M. Murnane
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  6. Henry C. Kapteyn
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  7. Keith A. Nelson
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Editor information

Editors and Affiliations

  1. Steacie Institute for Molecular Sciences, National Research Council Canada, 100 Sussex Drive, Rm 2063, Ottawa, ON, K1A 0R6, Canada

    Paul Corkum

  2. Department of Chemistry & Biochemistry 215 UCB, University of Colorado, Boulder, Boulder, CO, 80309-0215, USA

    David M. Jonas

  3. Department of Chemistry, University of Toronto, 80 St. George Street, Toronto, ON, M5S 3H6, Canada

    R. J. Dwayne. Miller

  4. School of Electrical & Computer Engineering, Purdue University, 1285 Elec. Eng. Bldg., West Lafayette, IN, 47907-1285, USA

    Andrew M. Weiner

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© 2007 Springer-Verlag Berlin Heidelberg

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Cite this paper

Tobey, R.I. et al. (2007). Ultrafast Extreme Ultraviolet Holography: Dynamic Monitoring of Surface Deformation. In: Corkum, P., Jonas, D.M., Miller, R.J.D., Weiner, A.M. (eds) Ultrafast Phenomena XV. Springer Series in Chemical Physics, vol 88. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-68781-8_14

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