X-Ray Microscopy II

Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987

  • David Sayre
  • Janos Kirz
  • Malcolm Howells
  • Harvey Rarback
Conference proceedings

DOI: 10.1007/978-3-540-39246-0

Part of the Springer Series in Optical Sciences book series (SSOS, volume 56)

Table of contents

  1. Front Matter
    Pages I-XIV
  2. Introduction

    1. D. Sayre, M. Howells, J. Kirz, H. Rarback
      Pages 1-2
  3. X-Ray Sources

    1. Front Matter
      Pages 3-3
    2. H. Rarback, C. Jacobson, J. Kirz, I. McNulty
      Pages 10-15
    3. W. Neff, J. Eberle, R. Holz, F. Richter, R. Lebert
      Pages 22-29
    4. J. Trebes, S. Brown, E. M. Campbell, N. M. Ceglio, D. Eder, D. Gaines et al.
      Pages 30-35
    5. C. H. Skinner, D. E. Kim, A. Wouters, D. Voorhees, S. Suckewer
      Pages 36-42
    6. A. Damerell, E. Madraszek, F. O’Neill, N. Rizvi, R. Rosser, P. Rumsby
      Pages 43-45
    7. D. DiCicco, L. Meixler, C. H. Skinner, S. Suckewer, J. Hirschberg, E. Kohen
      Pages 46-49
    8. C. Hills, R. Feder, A. Ng, R. Rosser, R. Speer
      Pages 50-53
    9. Gwo-Jen Jan
      Pages 54-58
    10. A. G. Michette, R. E. Burge, A. M. Rogoyski, F. O’Neill, I. C. E. Turcu
      Pages 59-62
    11. H. A. Padmore, P. J. Duke, R. E. Burge, A. G. Michette
      Pages 63-67
  4. X-Ray Optics and Components

    1. Front Matter
      Pages 69-69
    2. V. Bögli, P. Unger, H. Beneking, B. Greinke, P. Guttmann, B. Niemann et al.
      Pages 80-87
    3. C. J. Buckley, M. T. Browne, R. E. Burge, P. Charalambous, K. Ogawa, T. Takeyoshi
      Pages 88-94
    4. R. Hilkenbach, J. Thieme, P. Guttmann, B. Niemann
      Pages 95-101

About these proceedings

Introduction

This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub­ ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im­ portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre­ sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou­ bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con­ tributions and for their efforts in adhering to the guidelines on manuscript preparation.

Keywords

Absorption X-ray coherence development diffraction growth holography image processing laser microscopy optics preparation quality scattering synchrotron radiation

Editors and affiliations

  • David Sayre
    • 1
  • Janos Kirz
    • 2
  • Malcolm Howells
    • 3
  • Harvey Rarback
    • 4
  1. 1.IBM T.J. Watson Research CenterYorktown HeightsUSA
  2. 2.Department of PhysicsState University of New YorkStony BrookUSA
  3. 3.Center for X-Ray Optics, Lawrence Berkeley LaboratoryUniversity of California at BerkeleyBerkeleyUSA
  4. 4.National Synchrotron Light SourceBrookhaven National LaboratoryUptonUSA

Bibliographic information

  • Copyright Information Springer-Verlag Berlin Heidelberg 1988
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-662-14490-9
  • Online ISBN 978-3-540-39246-0
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534