X-Ray Microscopy

Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983

  • Günter Schmahl
  • Dietbert Rudolph
Conference proceedings

DOI: 10.1007/978-3-540-38833-3

Part of the Springer Series in Optical Sciences book series (SSOS, volume 43)

Table of contents

  1. Front Matter
    Pages I-IX
  2. Introduction

    1. G. Schmahl, D. Rudolph
      Pages 1-2
  3. X-Ray Sources

  4. X-Ray Optics

    1. Front Matter
      Pages 39-39
    2. R. O. Tatchyn
      Pages 40-50
    3. H. I. Smith, E. H. Anderson, A. M. Hawryluk, M. L. Schattenburg
      Pages 51-62
    4. G. Schmahl, D. Rudolph, P. Guttmann, O. Christ
      Pages 63-74
    5. N. M. Ceglio
      Pages 97-108
    6. A. G. Michette, M. T. Browne, P. Charalambous, R. E. Burge, M. J. Simpson, P. J. Duke
      Pages 109-118
    7. A. Franks, B. Gale
      Pages 129-138
    8. T. W. Barbee Jr.
      Pages 144-162

About these proceedings

Keywords

Röntgenstrahlmikroskopie X-ray electron microscopy microscopy optics synchrotron radiation

Editors and affiliations

  • Günter Schmahl
    • 1
  • Dietbert Rudolph
    • 1
  1. 1.Forschungsgruppe RöntgenmikroskopieUniversität GöttingenGöttingenFed. Rep. of Germany

Bibliographic information

  • Copyright Information Springer-Verlag Berlin Heidelberg 1984
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-662-13547-1
  • Online ISBN 978-3-540-38833-3
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534