Overview
- Enables readers to understand long-term reliability of an integrated circuit
- Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes
- Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology
- Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit
- Includes supplementary material: sn.pub/extras
Part of the book series: Analog Circuits and Signal Processing (ACSP)
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Table of contents (7 chapters)
Keywords
About this book
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.
The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Authors and Affiliations
Bibliographic Information
Book Title: Analog IC Reliability in Nanometer CMOS
Authors: Elie Maricau, Georges Gielen
Series Title: Analog Circuits and Signal Processing
DOI: https://doi.org/10.1007/978-1-4614-6163-0
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media New York 2013
Hardcover ISBN: 978-1-4614-6162-3Published: 09 January 2013
Softcover ISBN: 978-1-4899-8630-6Published: 19 June 2015
eBook ISBN: 978-1-4614-6163-0Published: 11 January 2013
Series ISSN: 1872-082X
Series E-ISSN: 2197-1854
Edition Number: 1
Number of Pages: XVI, 198
Topics: Circuits and Systems, Electronics and Microelectronics, Instrumentation, Nanotechnology and Microengineering