Applied Scanning Probe Methods II

Scanning Probe Microscopy Techniques

ISBN: 978-3-540-26242-8 (Print) 978-3-540-27453-7 (Online)

Table of contents (11 chapters)

  1. No Access

    Book Chapter

    Pages 1-36

    Higher Harmonics in Dynamic Atomic Force Microscopy

  2. No Access

    Book Chapter

    Pages 37-90

    Atomic Force Acoustic Microscopy

  3. No Access

    Book Chapter

    Pages 91-119

    Scanning Ion Conductance Microscopy

  4. No Access

    Book Chapter

    Pages 121-141

    Spin-Polarized Scanning Tunneling Microscopy

  5. No Access

    Book Chapter

    Pages 143-164

    Dynamic Force Microscopy and Spectroscopy

  6. No Access

    Book Chapter

    Pages 165-203

    Sensor Technology for Scanning Probe Microscopy and New Applications

  7. No Access

    Book Chapter

    Pages 205-239

    Quantitative Nanomechanical Measurements in Biology

  8. No Access

    Book Chapter

    Pages 241-281

    Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale

  9. No Access

    Book Chapter

    Pages 283-320

    Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices

  10. No Access

    Book Chapter

    Pages 321-360

    Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures

  11. No Access

    Book Chapter

    Pages 361-412

    Focused Ion Beam as a Scanning Probe: Methods and Applications