Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Authors:

ISBN: 978-0-7923-7991-1 (Print) 978-0-306-47040-0 (Online)

Table of contents (19 chapters)

  1. Introduction to Testing

    1. Front Matter

      Pages 1-1

    2. No Access

      Book Chapter

      Pages 3-16

      Introduction

    3. No Access

      Book Chapter

      Pages 17-34

      VLSI Testing Process and Test Equipment

    4. No Access

      Book Chapter

      Pages 35-55

      Test Economics and Product Quality

    5. No Access

      Book Chapter

      Pages 57-80

      Fault Modeling

  2. Test Methods

    1. Front Matter

      Pages 81-81

    2. No Access

      Book Chapter

      Pages 83-128

      Logic and Fault Simulation

    3. No Access

      Book Chapter

      Pages 129-154

      Testability Measures

    4. No Access

      Book Chapter

      Pages 155-210

      Combinational Circuit Test Generation

    5. No Access

      Book Chapter

      Pages 211-252

      Sequential Circuit Test Generation

    6. No Access

      Book Chapter

      Pages 253-308

      Memory Test

    7. No Access

      Book Chapter

      Pages 309-384

      DSP-Based Analog and Mixed-Signal Test

    8. No Access

      Book Chapter

      Pages 385-416

      Model-Based Analog and Mixed-Signal Test

    9. No Access

      Book Chapter

      Pages 417-438

      Delay Test

    10. No Access

      Book Chapter

      Pages 439-462

      IDDQ Test

  3. Design for Testability

    1. Front Matter

      Pages 463-463

    2. No Access

      Book Chapter

      Pages 465-488

      Digital DFT and Scan Design

    3. No Access

      Book Chapter

      Pages 489-548

      Built-In Self-Test

    4. No Access

      Book Chapter

      Pages 549-574

      Boundary Scan Standard

    5. No Access

      Book Chapter

      Pages 575-593

      Analog Test Bus Standard

    6. No Access

      Book Chapter

      Pages 595-612

      System Test and Core-Based Design

    7. No Access

      Book Chapter

      Pages 613-614

      The Future of Testing