Emerging Technologies and Circuits

Editors:

ISBN: 978-90-481-9378-3 (Print) 978-90-481-9379-0 (Online)

Table of contents (17 chapters)

  1. Front Matter

    Pages i-ix

  2. Introduction

    1. Front Matter

      Pages 1-1

    2. No Access

      Book Chapter

      Pages 3-13

      Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape

  3. Emerging Technologies and Circuits

    1. Front Matter

      Pages 15-15

    2. No Access

      Book Chapter

      Pages 17-35

      New State Variable Opportunities Beyond CMOS: A System Perspective

    3. No Access

      Book Chapter

      Pages 37-51

      A Simple Compact Model to Analyze the Impact of Ballistic and Quasi-Ballistic Transport on Ring Oscillator Performance

  4. Advanced Devices and Circuits

    1. Front Matter

      Pages 53-53

    2. No Access

      Book Chapter

      Pages 55-66

      Low-Voltage Scaled 6T FinFET SRAM Cells

    3. No Access

      Book Chapter

      Pages 67-79

      Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction

    4. No Access

      Book Chapter

      Pages 81-93

      Metal Gate Effects on a 32 nm Metal Gate Resistor

  5. Reliability and SEU

    1. Front Matter

      Pages 95-95

    2. No Access

      Book Chapter

      Pages 97-106

      Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric

    3. No Access

      Book Chapter

      Pages 107-120

      Analysis of SI Substrate Damage Induced by Inductively Coupled Plasma Reactor with Various Superposed Bias Frequencies

  6. Power, Timing and Variability

    1. Front Matter

      Pages 121-121

    2. No Access

      Book Chapter

      Pages 123-130

      CMOS SOI Technology for WPAN: Application to 60 GHZ LNA

    3. No Access

      Book Chapter

      Pages 131-139

      SRAM Memory Cell Leakage Reduction Design Techniques in 65 nm Low Power PD-SOI CMOS

    4. No Access

      Book Chapter

      Pages 141-161

      Resilient Circuits for Dynamic Variation Tolerance

    5. No Access

      Book Chapter

      Pages 163-177

      Process Variability-Induced Timing Failures – A Challenge in Nanometer CMOS Low-Power Design

    6. No Access

      Book Chapter

      Pages 179-189

      How Does Inverse Temperature Dependence Affect Timing Sign-Off

    7. No Access

      Book Chapter

      Pages 191-202

      CMOS Logic Gates Leakage Modeling Under Statistical Process Variations

    8. No Access

      Book Chapter

      Pages 203-217

      On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution

  7. Analog and Mixed Signal

    1. Front Matter

      Pages 219-219

    2. No Access

      Book Chapter

      Pages 221-247

      DC–DC Converter Technologies for On-Chip Distributed Power Supply Systems – 3D Stacking and Hybrid Operation

    3. No Access

      Book Chapter

      Pages 249-264

      Sampled Analog Signal Processing: From Software-Defined to Software Radio