Applied Scanning Probe Methods VIII

Scanning Probe Microscopy Techniques

Editors:

ISBN: 978-3-540-74079-7 (Print) 978-3-540-74080-3 (Online)

Table of contents (12 chapters)

  1. Front Matter

    Pages I-LIX

  2. No Access

    Book Chapter

    Pages 1-29

    Background-Free Apertureless Near-Field Optical Imaging

  3. No Access

    Book Chapter

    Pages 31-75

    Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes

  4. No Access

    Book Chapter

    Pages 77-135

    Near Field Probes: From Optical Fibers to Optical Nanoantennas

  5. No Access

    Book Chapter

    Pages 137-181

    Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging

  6. No Access

    Book Chapter

    Pages 183-217

    Scanning Probes for the Life Sciences

  7. No Access

    Book Chapter

    Pages 219-245

    Self-Sensing Cantilever Sensor for Bioscience

  8. No Access

    Book Chapter

    Pages 247-287

    AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication

  9. No Access

    Book Chapter

    Pages 289-314

    Cantilever Spring-Constant Calibration in Atomic Force Microscopy

  10. No Access

    Book Chapter

    Pages 315-350

    Frequency Modulation Atomic Force Microscopy in Liquids

  11. No Access

    Book Chapter

    Pages 351-376

    Kelvin Probe Force Microscopy: Recent Advances and Applications

  12. No Access

    Book Chapter

    Pages 377-420

    Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale

  13. No Access

    Book Chapter

    Pages 421-450

    Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy

  14. Back Matter

    Pages 451-465