Applied Scanning Probe Methods V

Scanning Probe Microscopy Techniques

ISBN: 978-3-540-37315-5 (Print) 978-3-540-37316-2 (Online)

Table of contents (10 chapters)

  1. Front Matter

    Pages I-XLV

  2. No Access

    Book Chapter

    Pages 1-22

    Integrated Cantilevers and Atomic Force Microscopes

  3. No Access

    Book Chapter

    Pages 23-49

    Electrostatic Microscanner

  4. No Access

    Book Chapter

    Pages 51-74

    Low-Noise Methods for Optical Measurements of Cantilever Deflections

  5. No Access

    Book Chapter

    Pages 75-97

    Q-controlled Dynamic Force Microscopy in Air and Liquids

  6. No Access

    Book Chapter

    Pages 99-112

    High-Frequency Dynamic Force Microscopy

  7. No Access

    Book Chapter

    Pages 113-148

    Torsional Resonance Microscopy and Its Applications

  8. No Access

    Book Chapter

    Pages 149-223

    Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy

  9. No Access

    Book Chapter

    Pages 225-267

    Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale

  10. No Access

    Book Chapter

    Pages 269-286

    New AFM Developments to Study Elasticity and Adhesion at the Nanoscale

  11. No Access

    Book Chapter

    Pages 287-329

    Near-Field Raman Spectroscopy and Imaging

  12. Back Matter

    Pages 331-344