2013

Nyquist AD Converters, Sensor Interfaces, and Robustness

Advances in Analog Circuit Design, 2012

ISBN: 978-1-4614-4586-9 (Print) 978-1-4614-4587-6 (Online)

Table of contents (15 chapters)

  1. Front Matter

    Pages i-x

  2. Nyquist A/D Converters

    1. Front Matter

      Pages 1-2

    2. No Access

      Book Chapter

      Pages 3-12

      High Performance Piplined A/D Converters in CMOS and BiCMOS Processes

    3. No Access

      Book Chapter

      Pages 13-30

      A 12-bit 800 MS/s Dual-Residue Pipeline ADC

    4. No Access

      Book Chapter

      Pages 31-49

      Time-Interleaved SAR and Slope Converters

    5. No Access

      Book Chapter

      Pages 51-71

      GS/s AD Conversion for Broadband Multi-stream Reception

    6. No Access

      Book Chapter

      Pages 73-96

      CMOS Ultra-High-Speed Time-Interleaved ADCs

    7. No Access

      Book Chapter

      Pages 97-114

      CMOS ADCs for Optical Communications

  3. Capacitive Sensor Interfaces

    1. Front Matter

      Pages 115-115

    2. No Access

      Book Chapter

      Pages 117-127

      Motion MEMS and Sensors, Today and Tomorrow

    3. No Access

      Book Chapter

      Pages 129-147

      Energy-Efficient Capacitive Sensor Interfaces

    4. No Access

      Book Chapter

      Pages 149-174

      Interface Circuits for MEMS Microphones

    5. No Access

      Book Chapter

      Pages 175-199

      Front End Electronics for Solid State Detectors in Today and Future High Energy Physics Experiments

  4. Robustness

    1. Front Matter

      Pages 201-201

    2. No Access

      Book Chapter

      Pages 203-221

      How Can Chips Live Under Radiation?

    3. No Access

      Book Chapter

      Pages 223-243

      Radiation-Tolerant MASH Delta-Sigma Time-to-Digital Converters

    4. No Access

      Book Chapter

      Pages 245-267

      A Designer’s View on Mismatch

    5. No Access

      Book Chapter

      Pages 269-279

      Analog Circuit Design in Organic Thin-Film Transistor Technologies on Foil: An Overview

    6. No Access

      Book Chapter

      Pages 281-291

      Impact of Statistical Variability on FinFET Technology: From Device, Statistical Compact Modelling to Statistical Circuit Simulation