Book 2013

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices


ISBN: 978-1-4614-4336-0 (Print) 978-1-4614-4337-7 (Online)

Table of contents (18 chapters)

  1. Front Matter

    Pages i-xv

  2. Materials Issues and Reliability of Optical Devices

    1. Front Matter

      Pages 1-1

    2. Chapter

      Pages 3-17

      Reliability Testing of Semiconductor Optical Devices

    3. Chapter

      Pages 19-53

      Failure Analysis of Semiconductor Optical Devices

    4. Chapter

      Pages 55-85

      Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

    5. Chapter

      Pages 87-122

      Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation

    6. Chapter

      Pages 123-145

      Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes

    7. Chapter

      Pages 147-205

      Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers

    8. Chapter

      Pages 207-245

      Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes

    9. Chapter

      Pages 247-261

      InGaN Laser Diode Degradation

    10. Chapter

      Pages 263-281

      Radiation-Enhanced Dislocation Glide: The Current Status of Research

    11. Chapter

      Pages 283-316

      Mechanism of Defect Reactions in Semiconductors

  3. Materials Issues and Reliability of Electron Devices

    1. Front Matter

      Pages 317-317

    2. Chapter

      Pages 319-379

      Reliability Studies in the Real World

    3. Chapter

      Pages 381-429

      Strain Effects in AlGaN/GaN HEMTs

    4. Chapter

      Pages 431-453

      Reliability Issues in AlGaN/GaN High Electron Mobility Transistors

    5. Chapter

      Pages 455-474

      GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors

    6. Chapter

      Pages 475-513

      Novel Dielectrics for GaN Device Passivation and Improved Reliability

    7. Chapter

      Pages 515-544

      Reliability Simulation

    8. Chapter

      Pages 545-582

      The Analysis of Wide Band Gap Semiconductors Using Raman Spectroscopy

    9. Chapter

      Pages 583-610

      Reliability Study of InP-Based HBTs Operating at High Current Density

  4. Back Matter

    Pages 611-616