2011

Scanning Transmission Electron Microscopy

Imaging and Analysis

Editors:

ISBN: 978-1-4419-7199-9 (Print) 978-1-4419-7200-2 (Online)

Table of contents (18 chapters)

  1. Front Matter

    Pages i-xii

  2. No Access

    Book Chapter

    Pages 1-90

    A Scan Through the History of STEM

  3. No Access

    Book Chapter

    Pages 91-115

    The Principles of STEM Imaging

  4. No Access

    Book Chapter

    Pages 117-161

    The Electron Ronchigram

  5. No Access

    Book Chapter

    Pages 163-205

    Spatially Resolved EELS: The Spectrum-Imaging Technique and Its Applications

  6. No Access

    Book Chapter

    Pages 207-245

    Energy Loss Near-Edge Structures

  7. No Access

    Book Chapter

    Pages 247-289

    Simulation and Interpretation of Images

  8. No Access

    Book Chapter

    Pages 291-351

    X-Ray Energy-Dispersive Spectrometry in Scanning Transmission Electron Microscopes

  9. No Access

    Book Chapter

    Pages 353-392

    STEM Tomography

  10. No Access

    Book Chapter

    Pages 393-427

    Scanning Electron Nanodiffraction and Diffraction Imaging

  11. No Access

    Book Chapter

    Pages 429-466

    Applications of Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy to Complex Oxide Materials

  12. No Access

    Book Chapter

    Pages 467-521

    Application to Ceramic Interfaces

  13. No Access

    Book Chapter

    Pages 523-536

    Application to Semiconductors

  14. No Access

    Book Chapter

    Pages 537-582

    Nanocharacterization of Heterogeneous Catalysts by Ex Situ and In Situ STEM

  15. No Access

    Book Chapter

    Pages 583-614

    Structure of Quasicrystals

  16. No Access

    Book Chapter

    Pages 615-658

    Atomic-Resolution STEM at Low Primary Energies

  17. No Access

    Book Chapter

    Pages 659-688

    Low-Loss EELS in the STEM

  18. No Access

    Book Chapter

    Pages 689-723

    Variable Temperature Electron Energy-Loss Spectroscopy

  19. No Access

    Book Chapter

    Pages 725-756

    Fluctuation Microscopy in the STEM

  20. Back Matter

    Pages 757-762