2007

Scanning Probe Microscopy

Electrical and Electromechanical Phenomena at the Nanoscale

Editors:

ISBN: 978-0-387-28667-9 (Print) 978-0-387-28668-6 (Online)

Table of contents (36 chapters)

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  1. Front Matter

    Pages i-xx

  2. Introduction

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      Book Chapter

      Pages 1-8

      Introduction

  3. SPM Techniques for Electrical Characterization

    1. Front Matter

      Pages 9-9

    2. No Access

      Book Chapter

      Pages 11-30

      Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport

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      Book Chapter

      Pages 31-87

      Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy

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      Book Chapter

      Pages 88-112

      Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics

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      Book Chapter

      Pages 113-131

      Principles of Kelvin Probe Force Microscopy

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      Book Chapter

      Pages 132-172

      Frequency-Dependent Transport Imaging by Scanning Probe Microscopy

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      Book Chapter

      Pages 173-214

      Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy

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      Book Chapter

      Pages 215-253

      Principles of Near-Field Microwave Microscopy

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      Book Chapter

      Pages 254-279

      Electromagnetic Singularities and Resonances in Near-Field Optical Probes

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      Book Chapter

      Pages 280-314

      Electrochemical SPM

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      Book Chapter

      Pages 315-345

      Near-Field High-Frequency Probing

  4. Electrical and Electromechanical Imaging at the Limits of Resolution

    1. Front Matter

      Pages 347-347

    2. No Access

      Book Chapter

      Pages 349-371

      Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors

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      Book Chapter

      Pages 372-394

      Spin-Polarized Scanning Tunneling Microscopy

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      Book Chapter

      Pages 395-422

      Scanning Probe Measurements of Electron Transport in Molecules

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      Book Chapter

      Pages 423-439

      Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices

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      Book Chapter

      Pages 440-454

      Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks

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      Book Chapter

      Pages 455-479

      Theory of Scanning Probe Microscopy

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      Book Chapter

      Pages 480-505

      Multi-Probe Scanning Tunneling Microscopy

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      Book Chapter

      Pages 506-533

      Dynamic Force Microscopy and Spectroscopy in Vacuum

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      Book Chapter

      Pages 534-558

      Scanning Tunneling Microscopy and Spectroscopy of Manganites

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