Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

Editors:

ISBN: 978-1-4020-2169-5 (Print) 978-1-4020-2170-1 (Online)

Table of contents (41 chapters)

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  1. Noise Sources

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      Pages 3-10

      1/f Noise Sources

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      Pages 11-18

      Noise Sources in GaN/AlGaN Quantum Wells and Devices

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      Pages 19-27

      1/f Noise in Nanomaterials and Nanostructurea: Old Questions in a New Fashion

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      Pages 29-36

      1/f Spectra as a Consequence of the Randomness of Variance

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      Pages 37-44

      Quantum Phase Locking, 1/f Noise and Entanglement

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      Pages 45-52

      Shot Noise in Mesoscopic Devices and Quantum Dot Networks

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      Pages 53-60

      Super-Poissonian Noise in Nanostructures

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      Pages 61-68

      Stochastic and Deterministic Models of Noise

  2. Noise in Nanoscale Devices

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      Pages 71-78

      Noise in Optoelectronic Devices

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      Pages 79-88

      Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers

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      Pages 89-96

      Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels

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      Pages 97-107

      Noise of High Temperature Superconducting Bolometers

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      Pages 109-120

      1/f Noise in MOSTs: Faster is Noisier

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      Pages 121-128

      Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs

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      Pages 129-136

      Noise and Tunneling Through the 2.5 nm Gate Oxide in Soi MOSFETs

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      Pages 137-144

      Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors

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      Pages 145-152

      Noise Modelling in Low Dimensional Electronic Structures

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      Pages 153-160

      Correlation Noise Measurements and Modeling of Nanoscale MOSFETs

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      Pages 161-168

      Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs

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      Book Chapter

      Pages 169-176

      High Frequency Noise Sources Extraction in Nanometique MOSFETs

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