Overview
- New edition of successful, well-reviewed textbook
- Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry
- Shows how wave radiation probes the structure of materials
- Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications
- Explains the mathematics needed consistently through the book
- Helps to extend knowledge by indicating further reading
- Explains concepts in detail, with no requirement for different reference materials
- Includes supplementary material: sn.pub/extras
Part of the book series: Graduate Texts in Physics (GTP)
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Table of contents (13 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Reviews
John Hutchison in Journal of Microscopy
``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.''
Ray Egerton in Micron
``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.''
John C. H. Spence, Arizona State University
``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’
Colin Humphreys, Cambridge University
``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’
Ronald Gronsky, University of California, Berkeley
Authors and Affiliations
About the authors
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.
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James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
Bibliographic Information
Book Title: Transmission Electron Microscopy and Diffractometry of Materials
Authors: Brent Fultz, James Howe
Series Title: Graduate Texts in Physics
DOI: https://doi.org/10.1007/978-3-642-29761-8
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2013
Hardcover ISBN: 978-3-642-29760-1Published: 14 October 2012
Softcover ISBN: 978-3-642-43315-3Published: 09 November 2014
eBook ISBN: 978-3-642-29761-8Published: 13 October 2012
Series ISSN: 1868-4513
Series E-ISSN: 1868-4521
Edition Number: 4
Number of Pages: XX, 764
Topics: Spectroscopy and Microscopy, Characterization and Evaluation of Materials, Spectroscopy/Spectrometry, Surfaces and Interfaces, Thin Films, Surface and Interface Science, Thin Films