Overview
- Summarizes the current state-of-the-art in LiNbO3 research
- Provides basic materials information and a survey of applications of this material
- Serves as a reference work for both researchers and engineers
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 115)
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Table of contents (7 chapters)
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Front Matter
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Back Matter
Keywords
About this book
The book presents the current state of studies of point defects, both intrinsic and extrinsic (impurities, radiation centers, etc.), in LiNbO3. The contribution of intrinsic defects to photoinduced charge transport, i.e. to the photorefraction, is explained. The photorefractive and optical properties of LiNbO3 crystals with different stoichiometry and of those doped with so-called "optical-damage resistant" impurities controlling the intrinsic defect structure are described in detail. Applications included are to the problem of non-erasable recording of photorefractive holograms in LiNbO3 and the current situation of studies in the ferroelectric switching and domain structure of LiNbO3, as well as the creation of periodically-poled structures for the optical frequency conversion.
Authors and Affiliations
Bibliographic Information
Book Title: Lithium Niobate
Book Subtitle: Defects, Photorefraction and Ferroelectric Switching
Authors: Tatyana Volk, Manfred Wöhlecke
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-3-540-70766-0
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2009
Hardcover ISBN: 978-3-540-70765-3Published: 02 October 2008
Softcover ISBN: 978-3-642-08966-4Published: 23 November 2010
eBook ISBN: 978-3-540-70766-0Published: 13 September 2008
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XIV, 250
Number of Illustrations: 100 b/w illustrations, 2 illustrations in colour
Topics: Optical and Electronic Materials, Solid State Physics, Spectroscopy and Microscopy, Engineering, general