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Process Variations and Probabilistic Integrated Circuit Design

  • Book
  • © 2012

Overview

Editors:
  1. Manfred Dietrich

    1. Integrierte Schaltungen, Institutsteil Entwurfsautomatisierung, Fraunhofer -Institut fur, Dresden, Germany

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  2. Joachim Haase

    1. Integrierte Schaltungen, Institutsteil Entwurfsautomatisierung, Fraunhofer -Institut fur, Dresden, Germany

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  • Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design Describes critical effects of process variation using simple examples that can be reproduced by the reader

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Table of contents (6 chapters)

  1. Front Matter

    Pages i-xvi
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  2. Introduction

    • Joachim Haase, Manfred Dietrich
    Pages 1-10

  3. Physical and Mathematical Fundamentals

    • Bernd Lemaitre, Christoph Sohrmann, Lutz Muche, Joachim Haase
    Pages 11-67

  4. Examination of Process Parameter Variations

    • Emrah Acar, Hendrik Mau, Andy Heinig, Bing Li, Ulf Schlichtmann
    Pages 69-89

  5. Methods of Parameter Variations

    • Christoph Knoth, Ulf Schlichtmann, Bing Li, Min Zhang, Markus Olbrich, Emrah Acar et al.
    Pages 91-179

  6. Consequences for Circuit Design and Case Studies

    • Alyssa C. Bonnoit, Reimund Wittmann
    Pages 181-213

  7. Conclusion

    • Manfred Dietrich
    Pages 215-222

  8. Back Matter

    Pages 223-249
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Keywords

About this book

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

Editors and Affiliations

  • Integrierte Schaltungen, Institutsteil Entwurfsautomatisierung, Fraunhofer -Institut fur, Dresden, Germany

    Manfred Dietrich, Joachim Haase

Bibliographic Information

  • Book Title: Process Variations and Probabilistic Integrated Circuit Design

  • Editors: Manfred Dietrich, Joachim Haase

  • DOI: https://doi.org/10.1007/978-1-4419-6621-6

  • Publisher: Springer New York, NY

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer Science+Business Media, LLC 2012

  • Hardcover ISBN: 978-1-4419-6620-9

  • Softcover ISBN: 978-1-4899-8860-7

  • eBook ISBN: 978-1-4419-6621-6

  • Edition Number: 1

  • Number of Pages: XVI, 252

  • Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design

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