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  • © 2007

Science of Microscopy

  • Full-length essays on each type of instrument or technique
  • Applications to both materials science and the biomedical sciences
  • Essay-length treatment by respected experts in each field
  • Covers the latest developments as well as background information for the beginning microscopist
  • Includes supplementary material: sn.pub/extras

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Table of contents (20 chapters)

  1. Front Matter

    Pages i-xviii
  2. Imaging With Electrons

    1. Atomic Resolution Transmission Electron Microscopy

      • Angus I. Kirkland, Shery L. -Y. Chang, John L. Hutchison
      Pages 3-64
    2. Scanning Transmission Electron Microscopy

      • Peter D. Nellist
      Pages 65-132
    3. Scanning Electron Microscopy

      • Rudolf Reichelt
      Pages 133-272
    4. Analytical Electron Microscopy

      • Gianluigi Botton
      Pages 273-405
    5. High-Speed Electron Microscopy

      • Wayne E. King, Michael R. Armstrong, Oleg Bostanjoglo, Bryan W. Reed
      Pages 406-444
    6. In Situ Transmission Electron Microscopy

      • Frances M. Ross
      Pages 445-534
    7. Cryoelectron Tomography (CET)

      • Juergen M. Plitzko, Wolfgang Baumeister
      Pages 535-604
    8. LEEM and SPLEEM

      • Ernst Bauer
      Pages 605-656
    9. Photoemission Electron Microscopy (PEEM)

      • Jun Feng, Andreas Scholl
      Pages 657-695
    10. Aberration Correction

      • Peter W. Hawkes
      Pages 696-747
  3. Imaging With Photons

    1. Two-Photon Excitation Fluorescence Microscopy

      • Alberto Diaspro, Marc Schneider, Paolo Bianchini, Valentina Caorsi, Davide Mazza, Mattia Pesce et al.
      Pages 751-789
    2. Nanoscale Resolution in Far-Field Fluorescence Microscopy

      • Stefan W. Hell, Andreas Schönle, A. Van den Bos
      Pages 790-834
    3. Principles and Applications of Zone Plate X-Ray Microscopes

      • Malcolm Howells, Christopher Jacobsen, Tony Warwick, A. Van den Bos
      Pages 835-926
  4. Near-Field Scanning Probes

    1. Scanning Probe Microscopy in Materials Science

      • Maxim P. Nikiforov, Dawn A. Bonnell
      Pages 929-968
    2. Atomic Force Microscopy in the Life Sciences

      • Matthias Amrein
      Pages 1025-1069
    3. Low-Temperature Scanning Tunneling Microscopy

      • Uwe Weierstall
      Pages 1070-1138
  5. Holographic And Lensless Modes

    1. Electron Holography

      • Rafal E. Dunin-Borkowski, Takeshi Kasama, Martha R. McCartney, David J. Smith
      Pages 1141-1195
    2. Diffractive (Lensless) Imaging

      • John C. H. Spence
      Pages 1196-1227

About this book

New forms of imaging in science have nearly always led to major advances, especially at the nanoscale, and the pace of these developments has increased dramatically in recent decades. Many new types of microscopes have joined the traditional light microscope and the transmission and scanning electron microscopes during the past two decades. In the present volumes, a group of experts present comprehensive reviews of these new instruments and new versions of the older ones as well as associated techniques and draw attention to their principal areas of application. Numerous subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. Science of Microscopy will be an indispensable guide to a wide range of scientists in university laboratories as well as to engineers and scientists in industrial R&D departments.

Reviews

From the reviews:

In Science of Microscopy, comprehensive reviews set these innovations in the context of microscopy today. Each contribution presents a form of microscopy or occasionally a microscopic technique, and provides information about the instruments involved and their areas of application. The contributions are written in such a way that the reader can understand how the various instruments function, their strengths and weaknesses, and whether they are suitable for a particular scientific investigation. Science of Microscopy will be an indispensible guide to both a wide range of scientists in university laboratories and to engineers and scientists in industrial R&D departments.

"The Science of Microscopy presents 20 essays (in 2 volumes) covering topics within modern microscopy contributed by national and international experts. … Many of the essays contain a valuable section entitled ‘Relevance to Humans’, that talks about data pertinent to human applications. … The encyclopedia is highly recommended for science collections in large public, community college, and academic libraries." (Laura J. Bender, ARBA online, March, 2007)

"The editors of Science of Microscopy are notable authors and researchers in the areas of physics, optics, and electron microscopy. Hawkes and Spence are fully qualified to present this set (each editor also contributes an essay), which will be a valuable addition to academic libraries serving upper-level undergraduates and graduate students who need to learn various microscopic techniques." (Caroline L. Gilson, ARBA online, Vol. 39, 2008)

"This is an excellent book on the subject of modern microscopies. … Numerous detailed applications are given to guide the readers decision which instrument or technique seems to be best suited for retrieving information. … the book is aimed at institutions such as research groups and libraries. … could be a valuable source ofknowledge for both individual researchers and doctoral students." (Dr. Thomas Matzelle, Imaging and Microscopy, Vol. 10 (2), 2008)

Editors and Affiliations

  • CEMES CNRS, France

    Peter W. Hawkes

  • Arizona State University, Tempe, USA

    John C. H. Spence

About the editors

Peter Hawkes received his Ph.D. in physics from the University of Cambridge in 1963, after which he continued his research on electron optics, and in particular on aberration theory and image processing, in the Cavendish Laboratory until 1975. During this period, he was a Fellow of Peterhouse and of Churchill College. He then moved to the CNRS laboratory of Electron Optics in Toulouse, of which he was Director in 1987, and published extensively on electron lens aberrations and theoretical aspects of image processing. In 2002, he was awarded the status of Emeritus CNRS Director of Research. He has been President of the French Microscopy Society and was Founder-President of the European Microscopy Society. He is author or editor of numerous books on electron optics and image processing, notably the three-volume Principles of Electron Optics (with E. Kasper). He is general editor of the series Advances in Imaging & Electron Physics and edited a special volume on the 'Beginnings of Electron Microscopy' with contributions from many of the founders of the subject. His most recent interest is the introduction of image algebra into electron optical thinking and he has published many historical articles on forgotten aspects of the subject. He has been a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy for many years. He has been a member of the advisory boards of numerous European and International Congresses on Electron Microscopy and was one of the founder-organizers of the series of Congresses on Charged-particle Optics, the third of which was organized by him in Toulouse in 1990. He is a fellow of the Optical Society of America and member of EMAG (Institute of Physics), the Microscopy Society of America, the European Microscopy Society, the French Microscopy Society and the Royal Microscopical Society. In 1983, he was awarded the Silver medal of the CNRS.

John Spence received his PhD in Physics from Melbourne in 1973 followed by post-doctoral work in Oxford, UK. He joined John Cowley's electron microscopy group at Arizona State University in 1977 where he is Regent's Professor of Physics. His group has worked in many areas connected with the development of novel microscopies and diffraction physics, especially quantitative convergent-beam electron diffraction and the multiple-scattering inversion problem. Instrumentation projects have included a time-of-flight spectrometer for scanning tunnelling microscopy, a point-projection field-emission microscope for molecular imaging (both with Weierstall), cathodoluminescence for scanning transmission electron microscopy (with Yamamoto), development with Tafto of the ALCHEMI method for locating foreign atoms in crystals using channeling effects on X-ray production in TEM, and development of perhaps the first direct-detection CCD camera for TEM. He was co-editor for North America of Acta Cryst. for ten years, is a Fellow of the American Physical Society, the Institute of Physics, Churchill College, and Chair of the International Union of Crystallography Commission on Electron Diffraction. He is the author of two texts (one with Zuo) on electron microscopy, and a member of the Scientific Advisory committees of the Advanced Light Source and Molecular Foundry at Lawrence Berkeley Laboratory, and of the department of energy's BESAC committee. His current interests include lensless (diffractive) imaging with electrons or X--rays, and use of laser-aligned protein beams for protein crystallography.

Bibliographic Information

Buy it now

Buying options

eBook USD 429.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 549.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 549.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

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