Abstract
A method for the nanoidentation of resistance coatings 1–100 nm thick and intended for use in microelectromechanical systems is proposed on the basis of atomic-force microscopy (AFM). The elastic moduli of the coatings are determined using three models of contact: the Hertz model, the Johnson-Kendall-Roberts model and the Makushkin model, with and without allowance for the influence of a solid substrate.
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Original Russian Text © S.O. Abetkovskaya, S.A. Chizhik, I.V. Pogoskaya, Z. Rimuza, D. Yazhabek, M. Mikhalovski, Ya. Linke, 2012, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2012, Vol. 76, No. 9, pp. 1122–1124.
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Abetkovskaya, S.O., Chizhik, S.A., Pogoskaya, I.V. et al. Determining the young modulus of nanosize thickness coatings for MEMS from the results of static force spectroscopy. Bull. Russ. Acad. Sci. Phys. 76, 1009–1011 (2012). https://doi.org/10.3103/S1062873812090031
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DOI: https://doi.org/10.3103/S1062873812090031