MOCVD grown MWIR HgCdTe detectors for high operation temperature conditions
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- Martyniuk, P., Koźniewski, A., Kębłowski, A. et al. Opto-Electron. Rev. (2014) 22: 118. doi:10.2478/s11772-014-0186-y
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The paper reports on photoelectrical performance of the mid-wave infrared HgCdTe detector for high operating temperature condition. Detector structure was simulated with APSYS numerical platform by Crosslight Inc. The comprehensive analysis of the detector performance such as dark current, detectivity, time response vs. device architecture and applied bias has been performed. The N+pP+n+ HgCdTe heterostructure photodiode operating in room temperature at a wavelength range of 2.6–3.6 μm enabled to reach: detectivity ∼8.7×1010 cmHz1/2/W, responsivity ∼1.72 A/W and time response ∼ 145 ps (V = 200 mV).