, Volume 27, Issue 4, pp 421-424
Date: 19 Dec 2008

Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations

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X-ray diffraction, atomic force microscopy and spectroscopic ellipsometry were used to study tetracene thin films as a function of deposition rate. A comparative analysis of the thickness and roughness values allows for detailed modelling of the film morphology. An interdigitated growth mode is established for the coexisting thin film and bulk phases. By comparison with the respective quinone-derivative of tetracene, we were additionally able to identify reaction products by their optical response.