The European Physical Journal D

, Volume 51, Issue 2, pp 173–177

Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip

Authors

    • Laboratoire Kastler Brossel, ENS, CNRS
  • A. Lupaşcu
    • Laboratoire Kastler Brossel, ENS, CNRS
  • G. Nogues
    • Laboratoire Kastler Brossel, ENS, CNRS
  • M. Brune
    • Laboratoire Kastler Brossel, ENS, CNRS
  • J.-M. Raimond
    • Laboratoire Kastler Brossel, ENS, CNRS
  • S. Haroche
    • Laboratoire Kastler Brossel, ENS, CNRS
    • Collège de France, 11 place Marcelin Berthelot
Highlight Paper Regular Article

DOI: 10.1140/epjd/e2009-00001-5

Cite this article as:
Emmert, A., Lupaşcu, A., Nogues, G. et al. Eur. Phys. J. D (2009) 51: 173. doi:10.1140/epjd/e2009-00001-5

Abstract

We have measured the trapping lifetime of magnetically trapped atoms in a cryogenic atom-chip experiment. An ultracold atomic cloud is kept at a fixed distance from a thin gold layer deposited on top of a superconducting trapping wire. The lifetime is studied as a function of the distances to the surface and to the wire. Different regimes are observed, where loss rate is determined either by the technical current noise in the wire or the Johnson-Nyquist noise in the metallic gold layer, in good agreement with theoretical predictions. Far from the surface, we observe exceptionally long trapping times for an atom-chip, in the 10 min range.

PACS

03.75.Be Atom and neutron optics37.10.Gh Atom traps and guides67.85.-d Ultracold gases, trapped gases

Copyright information

© EDP Sciences, SIF, Springer-Verlag Berlin Heidelberg 2009