The European Physical Journal D

, Volume 48, Issue 1, pp 3–10

Absolute frequency measurements of wavelength standards 532 nm, 543 nm, 633 nm and 1540 nm

Topical issue: Metrology and optical frequency combs

DOI: 10.1140/epjd/e2007-00325-0

Cite this article as:
Balling, P. & Křen, P. Eur. Phys. J. D (2008) 48: 3. doi:10.1140/epjd/e2007-00325-0

Abstract.

This paper describes the results of absolute frequency measurements of primary wavelength standards 633 nm, 543 nm, 532 nm, (iodine stabilized) and 1540 nm (acetylene stabilized) in CMI. The values obtained with Menlo Systems femtosecond frequency comb in CMI are compared with previous measurements of the same standards in BIPM, BEV and MPQ. Measured sub-Doppler linewidths and relative intensities of several hyperfine spectral components of iodine molecule are also presented.

PACS.

42.62.Fi Laser spectroscopy42.62.Eh Metrological applications; optical frequency synthesizers for precision spectroscopy06.30.Ft Time and frequency

Copyright information

© EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2007

Authors and Affiliations

  1. 1.Laboratories of fundamental metrologyCzech Metrology InstitutePraha 5Czech Republic