Article

The European Physical Journal B

, Volume 64, Issue 2, pp 193-199

First online:

Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers

  • H. MauryAffiliated withLaboratoire de Chimie Physique - Matière et Rayonnement, UPMC Univ Paris 06CNRS, UMR 7614
  • , P. JonnardAffiliated withLaboratoire de Chimie Physique - Matière et Rayonnement, UPMC Univ Paris 06CNRS, UMR 7614
  • , K. Le GuenAffiliated withLaboratoire de Chimie Physique - Matière et Rayonnement, UPMC Univ Paris 06CNRS, UMR 7614
  • , J. -M. AndréAffiliated withLaboratoire de Chimie Physique - Matière et Rayonnement, UPMC Univ Paris 06CNRS, UMR 7614
  • , Z. WangAffiliated withInstitute of Precision Optical Engineering, Department of Physics, Tongji University
  • , J. ZhuAffiliated withInstitute of Precision Optical Engineering, Department of Physics, Tongji University
  • , J. DongAffiliated withLaboratoire de Chimie Physique - Matière et Rayonnement, UPMC Univ Paris 06CNRS, UMR 7614Institute of Precision Optical Engineering, Department of Physics, Tongji University
  • , Z. ZhangAffiliated withInstitute of Precision Optical Engineering, Department of Physics, Tongji University
  • , F. BridouAffiliated withLaboratoire Charles Fabry de l’Institut d’Optique, CNRS, Univ Paris-Sud, Campus Polytechnique
    • , F. DelmotteAffiliated withLaboratoire Charles Fabry de l’Institut d’Optique, CNRS, Univ Paris-Sud, Campus Polytechnique
    • , C. HecquetAffiliated withLaboratoire Charles Fabry de l’Institut d’Optique, CNRS, Univ Paris-Sud, Campus Polytechnique
    • , N. MahneAffiliated withLaboratorio Nazionale TASC, INFM-CNR
    • , A. GigliaAffiliated withLaboratorio Nazionale TASC, INFM-CNR
    • , S. NannaroneAffiliated withLaboratorio Nazionale TASC, INFM-CNRDipartimento di Ingegneria dei Materiali e dellAmbiente, Universita di Modena e Reggio Emilia

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Abstract

The interplay between optical performance and the thermally activated interface chemistry of periodic Mg/SiC multilayers designed for application at 30.4 nm are investigated by optical (hard X-ray, soft X-ray and ultraviolet ranges, i.e. from 0.154 to 30.4 nm) reflectivity and X-ray emission spectroscopy. The multilayers are prepared by magnetron sputtering and then annealed up to a temperature of 500 °C. Two clear changes take place in the multilayer upon annealing. At first, between 200 and 300 °C a strong decrease of the reflectivity is observed, due to the development of interfacial roughness following the crystallization of the Mg layers. No interfacial compound is detected. Then, between 350 and 400 °C there is formation of the Mg2Si magnesium silicide at the interfaces following the reaction between the Mg and SiC layers. This also leads to the almost total loss of reflectivity of the multilayer. Thus, this kind of multilayer is thermally stable only for application requiring no heating above 200 °C.

PACS

68.65.Ac Multilayers 61.05.cm X-ray reflectometry (surfaces, interfaces, films) 78.70.En X-ray emission spectra and fluorescence 73.90.+f Other topics in electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures 66.30.Ny Chemical interdiffusion; diffusion barriers 68.35.Fx Diffusion; interface formation