The European Physical Journal B - Condensed Matter and Complex Systems

, Volume 38, Issue 3, pp 431–436

Optical characterization of ferroelectric Bi \(\mathsf{_{3.25}}\)La \(\mathsf{_{0.75}}\)Ti\(\mathsf{_{3}}\)O \(\mathsf{_{12}}\) thin films

Authors

    • National Laboratory for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of Sciences
  • Z. M. Huang
    • National Laboratory for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of Sciences
  • Y. N. Wu
    • National Laboratory for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of Sciences
  • S. H. Hu
    • National Laboratory for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of Sciences
  • G. S. Wang
    • National Laboratory for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of Sciences
  • J. H. Ma
    • National Laboratory for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of Sciences
  • J. H. Chu
    • National Laboratory for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of Sciences
Article

DOI: 10.1140/epjb/e2004-00136-7

Cite this article as:
Hu, Z.G., Huang, Z.M., Wu, Y.N. et al. Eur. Phys. J. B (2004) 38: 431. doi:10.1140/epjb/e2004-00136-7

Abstract.

Amorphous and crystalline Bi3.25La0.75Ti3O12 (BLT) thin films on vitreous silica and sapphire substrates are prepared from chemical solutions. Their optical properties are investigated by transmittance measurements at energies from 1.1 to 5.0 eV. A four-phase model consisting of air, surface rough layer, BLT, and substrate is used to simulate the measured transmittance spectra. The inverse synthesis method with a double Tauc-Lorentz (DTL) dispersion function is used to calculate the optical constants and film thicknesses. The dispersion of the refractive index in the transparent region agrees with Sellmeier’s dispersion relation. The absorption edges of the BLT films are different in the amorphous and crystalline cases.

Copyright information

© Springer-Verlag Berlin/Heidelberg 2004