Abstract
Bipolar resistive switching in metal-insulator-metal structures based on a double-layer insulator composed of a layer of yttria-stabilized zirconia (YSZ) containing 12 mol % Y2O3 and a layer of GeO x is studied. It is shown that the incorporation of an additional GeO x layer into the structure leads to a significant decrease in the variation of resistive switching parameters at both negative and positive voltages. Au/Zr/GeO x /YSZ/TiN structures exhibit a high stability of the resistance ratio in high-resistance and low-resistance states during cyclic switching. The studied structures can be used for designing next-generation nonvolatile memory elements.
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Original Russian Text © O.N. Gorshkov, I.N. Antonov, A.I. Belov, A.P. Kasatkin, A.N. Mikhaylov, 2014, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2014, Vol. 40, No. 3, pp. 12–19.
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Gorshkov, O.N., Antonov, I.N., Belov, A.I. et al. Resistive switching in metal-insulator-metal structures based on germanium oxide and stabilized zirconia. Tech. Phys. Lett. 40, 101–103 (2014). https://doi.org/10.1134/S1063785014020084
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DOI: https://doi.org/10.1134/S1063785014020084