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Effect of the morphology on the mechanisms of the magnetization reversal of multilayered thin Co/Pd films

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Abstract

A comparative study of the magnetization curves of continuous and porous multilayered Pd10nm /[Co0.3nm ]/Pd0.55nm ]15/Pd2nm films deposited on an anodized TiO2 template was performed by magnetometry. Based on the comparison of the dependences of coercive field H C on angle θ between the easy-magnetization axis and the direction of external magnetic field H with theoretical dependences HC(θ) for the magnetization reversal by domain walls motion (according to the Kondorski model) and the rotation of magnetic moments (by the Stoner–Wohlfarth model), the differences in the mechanisms of magnetization reversal for two mentioned types of the films were revealed. The correlation between the difference in the morphologies of the continuous and porous films and revealed change in the mechanisms of the magnetization reversal, as well as the changes in values of H C and calculated constants of the magnetic anisotropy, is discussed.

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Authors and Affiliations

  1. Institute for Nuclear Problems, Belarussian State University, ul. Bobruiskaya 11, Minsk, 220030, Belarus

    J. V. Kasiuk, A. A. Maksimenko & J. A. Fedotova

  2. The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Kraków, Poland

    A. A. Maksimenko & M. Marszałek

  3. Belarussian State University of Informatics and Radioelectronics, ul. Petrusya Brovki 6, Minsk, Belarus

    S. K. Lazaruk & O. V. Kupreeva

Authors
  1. J. V. Kasiuk
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  2. A. A. Maksimenko
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  3. J. A. Fedotova
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  4. M. Marszałek
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  5. S. K. Lazaruk
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  6. O. V. Kupreeva
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Correspondence to J. V. Kasiuk.

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Original Russian Text © J.V. Kasiuk, A.A. Maksimenko, J.A. Fedotova, M. Marszałek, S.K. Lazaruk, O.V. Kupreeva, 2016, published in Fizika Tverdogo Tela, 2016, Vol. 58, No. 11, pp. 2229–2236.

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Kasiuk, J.V., Maksimenko, A.A., Fedotova, J.A. et al. Effect of the morphology on the mechanisms of the magnetization reversal of multilayered thin Co/Pd films. Phys. Solid State 58, 2312–2319 (2016). https://doi.org/10.1134/S1063783416110160

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  • DOI: https://doi.org/10.1134/S1063783416110160

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