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Ultraviolet sensitization of high-energy heavy-ion tracks in polyethylene terephthalate

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Abstract

The reasons underlying the selective acceleration of the etching of heavy-ion tracks in polyethylene terephthalate irradiated by ultraviolet radiation (UV) are examined. The use of high-performance liquid chromatography, atomic-force microscopy, and infrared (IR) spectroscopy enable us to ascertain that etching is accelerated mainly due to the photodestruction of radiolysis products, which leads to the formation of an additional amount of low-molecular products with carboxyl groups in the region of tracks, thereby ultimately accelerating the polymer-etching process.

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Authors and Affiliations

  1. Federal Scientific-Research Centre Crystallography and Photonics, Russian Academy of Sciences, Moscow, 119333, Russia

    A. I. Vilensky

  2. Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences, Moscow, 119071, Russia

    K. G. Sabbatovsky

Authors
  1. A. I. Vilensky
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  2. K. G. Sabbatovsky
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Correspondence to A. I. Vilensky.

Additional information

Original Russian Text © A.I. Vilensky, K.G. Sabbatovsky, 2017, published in Poverkhnost’, 2017, No. 4, pp. 39–43.

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Vilensky, A.I., Sabbatovsky, K.G. Ultraviolet sensitization of high-energy heavy-ion tracks in polyethylene terephthalate. J. Surf. Investig. 11, 420–424 (2017). https://doi.org/10.1134/S1027451017020379

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  • DOI: https://doi.org/10.1134/S1027451017020379

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