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Morphology, structure, and composition of polycrystalline CdTe films grown on three-dimensional silicon substrates

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Abstract

Polycrystalline CdTe films have been produced on various substrates (glass, ITO-coated glass, sapphire, and microtextured silicon) by quasi-closed space growth, and their structural perfection and surface morphology have been studied by optical microscopy and scanning electron microscopy. Using an energy dispersive X-ray spectrometer and the scanning electron microscope, we have obtained the X-ray emission spectra of the CdTe films and determined their elemental composition. The morphological features of the films have been investigated and the cadmium-to-tellurium atomic ratio in the films has been determined experimentally.

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Authors and Affiliations

  1. Lviv Polytechnic National University, ul. St. Bandery 12, Lviv, 79013, Ukraine

    G. A. Il’chuk, I. V. Kurilo, R. Yu. Petrus’, V. V. Kus’nezh & T. N. Stan’ko

Authors
  1. G. A. Il’chuk
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  2. I. V. Kurilo
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  3. R. Yu. Petrus’
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  4. V. V. Kus’nezh
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  5. T. N. Stan’ko
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Correspondence to G. A. Il’chuk.

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Original Russian Text © G.A. Il’chuk, I.V. Kurilo, R.Yu. Petrus’, V.V. Kus’nezh, T.N. Stan’ko, 2013, published in Neorganicheskie Materialy, 2013, Vol. 49, No. 4, pp. 341–346.

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Il’chuk, G.A., Kurilo, I.V., Petrus’, R.Y. et al. Morphology, structure, and composition of polycrystalline CdTe films grown on three-dimensional silicon substrates. Inorg Mater 49, 329–334 (2013). https://doi.org/10.1134/S0020168513030059

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  • DOI: https://doi.org/10.1134/S0020168513030059

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