Abstract
The structure, electrical resistivity, and magnetoresistance of (50-nm)La0.67Ca0.33MnO3 epitaxial films grown on a [(80 nm)Ba0.25Sr0.75TiO3/La0.3Sr0.7Al0.65Ta0.35O3] substrate with a substantial positive lattice misfit have been studied. The tensile biaxial strains are shown to account for the increase in the cell volume and in the relative concentration of Mn+3 ions in the manganite films as compared to those for the original material (33%). The peak in the temperature dependence of the resistivity ρ of La0.67Ca0.33MnO3 films was shifted by 30–35 K toward lower temperatures relative to its position in the ρ(T) graph for a manganite film grown on (001)La0.3Sr0.7Al0.65Ta0.35O3. For T < 150 K, the temperature dependences of ρ of La0.67Ca0.33MnO3/Ba0.25Sr0.75TiO3/La0.3Sr0.7Al0.65Ta0.35O3 films could be well fitted by the relation ρ = ρ0 + ρ1 T 4.5, where ρ0 = 0.35 mΩ cm and the coefficient ρ1 decreases linearly with increasing magnetic field. In the temperature interval 4.2–300 K, the magnetoresistance of manganite films was within the interval 15–95% (μ0 H = 5 T).
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Translated from Fizika Tverdogo Tela, Vol. 47, No. 2, 2005, pp. 274–280.
Original Russian Text Copyright © 2005 by Bo\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l}\)kov, Claeson.
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Boikov, Y.A., Claeson, T. Response of the electrical resistivity and magnetoresistance of La0.67Ca0.33MnO3 films to biaxial tensile strains. Phys. Solid State 47, 287–292 (2005). https://doi.org/10.1134/1.1866408
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DOI: https://doi.org/10.1134/1.1866408