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Generation of π modes in semiconductor vertical-cavity surface-emitting lasers

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Abstract

We have theoretically and experimentally studied optical emission from the side faces of mesa structures for vertical-cavity surface-emitting lasers (VCSELs). The results of spatially resolved spectral measurements show that a new type of lasing modes is found in VCSELs with circular mesa structures, which corresponds to the π mode propagation along the mesa diameter with reflection from the sloped walls and the bottom Bragg mirror.

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Authors and Affiliations

  1. Ioffe Physical-Technical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russia

    G. S. Sokolovskii, V. V. Dudelev, A. M. Monakhov, S. A. Blokhin, A. G. Deryagin, S. A. Zolotovskaya, A. G. Kuzmenkov, S. N. Losev, N. A. Maleev & V. I. Kuchinskii

  2. St. Petersburg State Electrotechnical University, St. Petersburg, 197376, Russia

    A. Yu. Savenko & V. V. Luchinin

  3. Division of Electronic Engineering and Physics, University of Dundee, Dundee, DD1 4HN, UK

    E. U. Rafailov

  4. School of Physics and Astronomy, University of St. Andrews, St. Andrews, KY16 9SS, UK

    W. Sibbett

Authors
  1. G. S. Sokolovskii
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  2. V. V. Dudelev
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  3. A. M. Monakhov
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  4. A. Yu. Savenko
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  5. S. A. Blokhin
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  6. A. G. Deryagin
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  7. S. A. Zolotovskaya
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  8. A. G. Kuzmenkov
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  9. S. N. Losev
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  10. V. V. Luchinin
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  11. N. A. Maleev
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  12. E. U. Rafailov
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  13. W. Sibbett
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  14. V. I. Kuchinskii
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Corresponding author

Correspondence to G. S. Sokolovskii.

Additional information

Original Russian Text © G.S. Sokolovskii, V.V. Dudelev, A.M. Monakhov, A.Yu. Savenko, S.A. Blokhin, A.G. Deryagin, S.A. Zolotovskaya, A.G. Kuzmenkov, S.N. Losev, V.V. Luchinin, N.A. Maleev, E.U. Rafailov, W. Sibbett, V.I. Kuchinskii, 2009, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2009, Vol. 35, No. 24, pp. 20–27.

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Sokolovskii, G.S., Dudelev, V.V., Monakhov, A.M. et al. Generation of π modes in semiconductor vertical-cavity surface-emitting lasers. Tech. Phys. Lett. 35, 1133–1136 (2009). https://doi.org/10.1134/S1063785009120189

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  • DOI: https://doi.org/10.1134/S1063785009120189

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