, Volume 33, Issue 2, pp 125-127

Calculating x-ray diffraction from multilayer lateral crystal structures with arbitrary shapes and composition profiles

Rent the article at a discount

Rent now

* Final gross prices may vary according to local VAT.

Get Access


A theory of x-ray diffraction in the vertical direction from a lateral crystal having an arbitrary shape and arbitrary depth-composition profile has been developed within the framework of the kinematic approximation. The results of a numerical simulation of diffraction patterns from such crystals in high-resolution triple-axis diffractometry scheme are presented.

Original Russian Text © V.I. Punegov, A.I. Maksimov, S.I. Kolosov, K.M. Pavlov, 2007, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2007, Vol. 33, No. 3, pp. 64–71.