Technical Physics

, Volume 54, Issue 4, pp 580–585

Low-field ion microscopy

Authors

    • Institute of Solid State Physics, Material Science and Technologies, National Research CenterKharkov Physicotechnical Institute
  • E. V. Sadanov
    • Institute of Solid State Physics, Material Science and Technologies, National Research CenterKharkov Physicotechnical Institute
  • O. A. Velikodnaya
    • Institute of Solid State Physics, Material Science and Technologies, National Research CenterKharkov Physicotechnical Institute
Surface, Electron and Ion Emission

DOI: 10.1134/S1063784209040215

Cite this article as:
Ksenofontov, V.A., Sadanov, E.V. & Velikodnaya, O.A. Tech. Phys. (2009) 54: 580. doi:10.1134/S1063784209040215

Abstract

Experimental data on field ion emission under high partial pressures of water vapor at room temperature are reported. A method for obtaining low-field ion images in the presence of water vapor is proposed and the potentialities, limitations, and prospects of using images in microscopy are considered.

PACS numbers

07.78.+s 79.70.+q

Copyright information

© Pleiades Publishing, Ltd. 2009