Fluorescent X-ray transport in microchannel plates
M. I. Mazuritskiy
Rostov State University
Atoms, Spectra, Radiations
Cite this article as:
Mazuritskiy, M.I. Jetp Lett. (2006) 84: 381. doi:10.1134/S0021364006190052
The X-ray absorption spectra of microchannel plates have been measured at grazing incidence of the primary radiation. The Si L components of X-ray absorption near-edge structure (XANES) spectra exhibit specific features for incident angles below a certain critical value. In order to explain the experimental data, a mechanism of selective X-ray fluorescence transport via microchannels is proposed, which is based on the notion of anomalous dispersion in the vicinity of the Si L absorption edge.