Inorganic Materials

, Volume 48, Issue 14, pp 1298–1303

Algorithm of processing the sequence of time-resolved atomic emission spectra for lowering the detection limits of elements

Authors

  • I. G. Shatalov
    • Institute of Automation and Electrometry, Siberian BranchRussian Academy of Sciences
    • VMK Optoelektronika Ltd
  • V. P. Kosykh
    • Institute of Automation and Electrometry, Siberian BranchRussian Academy of Sciences
    • Institute of Automation and Electrometry, Siberian BranchRussian Academy of Sciences
    • VMK Optoelektronika Ltd
  • O. A. Neklyudov
    • VMK Optoelektronika Ltd
Article

DOI: 10.1134/S0020168512140166

Cite this article as:
Shatalov, I.G., Kosykh, V.P., Labusov, V.A. et al. Inorg Mater (2012) 48: 1298. doi:10.1134/S0020168512140166
  • 41 Views

Abstract

An algorithm for the mathematical treatment of the sequence of time-resolved atomic emission spectra intended for separation of weak scintillations (flashes) of the analytical lines from noises and, as a consequence, for lowering the detection limits of the analyte elements is presented. It is shown that the application of the algorithm leads to a more than twofold increase in the signal-to-noise ratio in the time dependence graph of the intensity of an analytical peak of the analyte element. The algorithm is incorporated into the Atom Program.

Keywords

time-resolved spectroscopyatomic emission spectral analysisscintillationmultielement solidstate detectors

Copyright information

© Pleiades Publishing, Ltd. 2012