Article

Inorganic Materials

, Volume 48, Issue 14, pp 1298-1303

Algorithm of processing the sequence of time-resolved atomic emission spectra for lowering the detection limits of elements

  • I. G. ShatalovAffiliated withInstitute of Automation and Electrometry, Siberian Branch, Russian Academy of SciencesVMK Optoelektronika Ltd
  • , V. P. KosykhAffiliated withInstitute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences
  • , V. A. LabusovAffiliated withInstitute of Automation and Electrometry, Siberian Branch, Russian Academy of SciencesVMK Optoelektronika Ltd Email author 
  • , O. A. NeklyudovAffiliated withVMK Optoelektronika Ltd

Rent the article at a discount

Rent now

* Final gross prices may vary according to local VAT.

Get Access

Abstract

An algorithm for the mathematical treatment of the sequence of time-resolved atomic emission spectra intended for separation of weak scintillations (flashes) of the analytical lines from noises and, as a consequence, for lowering the detection limits of the analyte elements is presented. It is shown that the application of the algorithm leads to a more than twofold increase in the signal-to-noise ratio in the time dependence graph of the intensity of an analytical peak of the analyte element. The algorithm is incorporated into the Atom Program.

Keywords

time-resolved spectroscopy atomic emission spectral analysis scintillation multielement solidstate detectors