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Atomic Force Microscopy Study of TiO2 Films Obtained by the Sol-Gel Method

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Abstract

Atomic Force Microscopy (AFM) was used to study the influence of thermal treatments on the structural and textural properties of the sol-gel TiO2 films obtained from Ti(OC3H7i)4. X-ray diffraction (XRD), ellipsometric and porosity measurements have also been made.

The TiO2 sol-gel films were homogeneous, transparent and amorphous. Heat treatments in the 400–600°C range indicate that the films have a strong tendency to crystallization. The high initial homogeneity of the TiO2 films was preserved during the crystallization process. AFM shows that the thermally treated films exhibit uniform, monodispersed crystals.

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Authors and Affiliations

  1. Institute of Physical Chemistry, Romanian Academy, 202, Splaiul Independentei, 77208, Bucharest, Romania

    Maria Zaharescu & Maria Crisan

  2. J. Stefan Institute, Jamova 39, 61111, Ljubljana, Slovenija

    I. MuŠeviČ

Authors
  1. Maria Zaharescu
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  2. Maria Crisan
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  3. I. MuŠeviČ
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Zaharescu, M., Crisan, M. & MuŠeviČ, I. Atomic Force Microscopy Study of TiO2 Films Obtained by the Sol-Gel Method. Journal of Sol-Gel Science and Technology 13, 769–773 (1998). https://doi.org/10.1023/A:1008673812626

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  • DOI: https://doi.org/10.1023/A:1008673812626

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