, Volume 58, Issue 2, pp 369–390

Characterizing intellectual spaces between science and technology

  • Sujit Bhattacharya
  • Hildrun Kretschmer
  • Martin Meyer

DOI: 10.1023/A:1026244828759

Cite this article as:
Bhattacharya, S., Kretschmer, H. & Meyer, M. Scientometrics (2003) 58: 369. doi:10.1023/A:1026244828759


The paper presents a methodology for studying the interactions between science and technology. Our approach rests mostly on patent citation and co-word analysis. In particular, this study aims to delineate intellectual spaces in thin-film technology in terms of science/technology interaction. The universe of thin-film patents can be viewed as the macro-level and starting point of our analysis. Applying a bottom-up approach, intellectual spaces at the micro-level are defined by tracing prominent concepts in publications, patents, and their citations of scientific literature. In another step, co-word analysis is used to generate meso-level topics and sub-topics. Overlapping structures and specificities that emerge are explored in the light of theoretical understanding of science-technology interactions. In particular, one can distinguish prominent concepts among patent citations that either co-occur in both thin-film publications and patents or reach out to one of the two sides. Future research may address the question to what extent one can interpret directionality into this.

Copyright information

© Kluwer Academic Publisher/Akadémiai Kiadó 2003

Authors and Affiliations

  • Sujit Bhattacharya
    • 1
  • Hildrun Kretschmer
    • 2
  • Martin Meyer
    • 3
  1. 1.National Institute of Science Technology and Development Studies (NISTADS)New DelhiIndia
  2. 2.NERDIThe Royal Academy of Arts and Sciences (NIWI-KNAW)Amsterdam (The Netherlands
  3. 3.Steunpunt O&O Statistieken, Katholieke Universiteit LeuvenLeuven (Belgium