Characterization of the Si:As Blocked Impurity Band (BIB) Detector in Keck's Long Wavelength Spectrometer (LWS)
- Randall D. Campbell
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Keck's Long Wavelength Spectrometer (LWS), is the facility instrument used for imaging and spectroscopy in the wavelength range of 3–28 μm at the Keck Observatory. LWS uses an 128 × 128 Si:As blocked impurity band (BIB) array manufactured by the Boeing Corporation. This paper discusses the method used for optimizing the detector's operating parameters at a temperature of 8.5 K and bias voltage of 1.2 V. A process for characterizing detective quantum efficiency of BIB detectors is also presented.
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- Characterization of the Si:As Blocked Impurity Band (BIB) Detector in Keck's Long Wavelength Spectrometer (LWS)
Volume 14, Issue 1 , pp 57-60
- Cover Date
- Print ISSN
- Online ISSN
- Springer Netherlands
- Additional Links
- Long Wavelength Spectrometer (LWS)
- Blocked Impurity Band (BIB) detectors
- quantum yield
- gain dispersion
- detective quantum efficiency
- Author Affiliations
- 1. W. M. Keck Observatory, USA