, Volume 9, Issue 5, pp 349-352

Molecular Structure of Silicon Tetraiodide

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Abstract

The molecular geometry of silicon tetraiodide was determined by gas-phase electron diffraction at 378 K. The molecule has a regular tetrahedral shape with an Si—I bond length (r g) of 2.432(5) Å and an I⋅⋅⋅I nonbonded distance (r g) of 3.971(8) Å. There is an apparent anharmonicity in both the stretching and the bending vibrations, with the latter especially pronounced.