Topics in Catalysis

, Volume 10, Issue 3, pp 143–155

XAFS spectroscopy; fundamental principles and data analysis

  • D.C. Koningsberger
  • B.L. Mojet
  • G.E. van Dorssen
  • D.E. Ramaker
Article

DOI: 10.1023/A:1019105310221

Cite this article as:
Koningsberger, D., Mojet, B., van Dorssen, G. et al. Topics in Catalysis (2000) 10: 143. doi:10.1023/A:1019105310221

Abstract

The physical principles of XAFS spectroscopy are given at a sufficiently basic level to enable scientists working in the field of catalysis to critically evaluate articles dealing with XAFS studies on catalytic materials. The described data-analysis methods provide the basic tools for studying the electronic and structural properties of supported metal, metal–oxide or metal–sulfide catalysts. These methods include (a) fitting in R-space, (b) application of the difference file technique and (c) control of the fit procedure with k1 and k3 weighting with the help of phase- and amplitude-corrected Fourier transforms.

XAFS physical principlesXAFS data analysisfitting in R-spacedetection of low Z scatterersphase- and amplitude-corrected Fourier transformsdifference file techniqueuse of theoretical references

Copyright information

© Kluwer Academic Publishers 2000

Authors and Affiliations

  • D.C. Koningsberger
    • 1
  • B.L. Mojet
    • 1
  • G.E. van Dorssen
    • 1
  • D.E. Ramaker
    • 2
  1. 1.Department of Inorganic Chemistry and CatalysisDebye Institute, Utrecht UniversityThe Netherlands
  2. 2.Department of Chemistry and Materials Science InstituteGeorge Washington UniversityUSA