Journal of Sol-Gel Science and Technology

, Volume 13, Issue 1, pp 769–773

Atomic Force Microscopy Study of TiO2 Films Obtained by the Sol-Gel Method

Authors

  • Maria Zaharescu
    • Institute of Physical ChemistryRomanian Academy
  • Maria Crisan
    • Institute of Physical ChemistryRomanian Academy
  • I. MuŠeviČ
    • J. Stefan Institute
Article

DOI: 10.1023/A:1008673812626

Cite this article as:
Zaharescu, M., Crisan, M. & MuŠeviČ, I. Journal of Sol-Gel Science and Technology (1998) 13: 769. doi:10.1023/A:1008673812626

Abstract

Atomic Force Microscopy (AFM) was used to study the influence of thermal treatments on the structural and textural properties of the sol-gel TiO2 films obtained from Ti(OC3H7i)4. X-ray diffraction (XRD), ellipsometric and porosity measurements have also been made.

The TiO2 sol-gel films were homogeneous, transparent and amorphous. Heat treatments in the 400–600°C range indicate that the films have a strong tendency to crystallization. The high initial homogeneity of the TiO2 films was preserved during the crystallization process. AFM shows that the thermally treated films exhibit uniform, monodispersed crystals.

TiO2 filmssol-gel methodAFM study

Copyright information

© Kluwer Academic Publishers 1998