Batchelor, B.G., Hill, D.A., and Hodgson, D.C. 1985. Automated Visual Inspection. IFS Publications Ltd.: Bedford, England.
Bajcsy, R., Lee, S.W., and Leonardis, A. 1990. Color image segmentation with detection of highlights and local illumination induced by interreflections. Proc. of Intl. Conf. on Pattern Recognition (ICPR), Atlantic City, NJ.
Beckmann, P. and Spizzichino, A. 1963. The Scattering of Electromagnetic Waves from Rough Surfaces. Pergamon: New York.
Born, M. and Wolf, E. 1965. Principles of Optics. Pergamon: London.
Boult, T.E. and Wolff, L.B. 1991. Physically based edge labeling. Proc. of IEEE Conf. on Computer Vision and Pattern Recognition (CVPR), Maui, Hawaii, pp. 656–663.
Brelstaff, G. and Blake, A. 1992. Detecting specular reflections using Lambertian constraints. Proc. of Intl. Conf. on Computer Vision (ICCV), Tampa, Florida, pp. 297–302.
Gershon, R. 1987. The use of color in computational vision. Ph.D. thesis, University of Toronto.
Handbook of Laser Science and Technology. M.J. Marvin (Ed.), CRC Press Inc., Vol. 4, 1988.
Handbook of Optics. W.G. Driscoll (Ed.), McGraw Hill Inc., 1978.
Klinker, G.J. 1993. A Physical Approach to Color Image Understanding. A.K. Peters, Wellesley: Massachusetts.
Klinker, G.J., Shafer, S.A., and Kanade, T. 1990. The measurement of highlights in color images. International Journal of Computer Vision, 2(1):7–32.
Koshikawa, K. 1979. A polarimetric approach to shape understanding. Proc. of Intl. Joint Conf. on Artificial Intelligence (IJCAI), pp. 493–495.
Lee, S.W. 1991. Understanding of surface reflection in computer vision by color and multiple views. Ph.D. thesis, University of Pennsylvania.
Mersch, S. 1984. Polarized lighting for machine vision applications. Proc. of RI/SME Third Annual Applied Machine Vision Conf., Schaumburg, pp. 40–54.
Nayar, S.K., Ikeuchi, K., and Kanade, T. 1991. Surface reflection: Physical and geometrical perspectives. IEEE Trans. on Pattern Analysis and Machine Intelligence, 13(7):611–634.
Novak, C. and Shafer, S. 1992. Anatomy of a color histogram. Proc. of IEEE Conf. on Computer Vision and Pattern Recognition (CVPR), pp. 599–605.
Oren, M. and Nayar, S.K. 1994. Seeing beyond Lambert's law. Proc. Third European Conference on Computer Vision, 2:269–280.
Polarization and Remote Sensing. W.G. Egan (Ed.), SPIE, Vol. 1747, July, 1992.
Sato, Y. and Ikeuchi, K. 1993. Temporal-color space analysis of reflection. Proc. of IEEE Conf. on Computer Vision and Pattern Recognition (CVPR), pp. 570–576.
Shafer, S. 1985. Using color to separate reflection components. Color Research and Applications, 10:210–218.
Shafer, S., Kanade, T., Klinker, G.J., and Novak, C.L. 1993. Physics-based models for early vision by machine. Proc. SPIE Conf. on Perceiving, Measuring and Using Color, vol. 1250.
Torrance, K. and Sparrow, E. 1967. Theory for off-specular reflection from roughened surfaces. Journal of the Optical Society of America, 57:1105–1114.
Wolff, L.B. and Boult, T.E. 1991. Constraining object features using a polarization reflectance model. IEEE Trans. on Pattern Analysis and Machine Intelligence, 13(7):635–657.
Wolff, L.B. 1992. A diffuse reflectance model for dielectric surfaces. Proc. SPIE Conf. on Optics, Illumination, and Image Sensing for Machine Vision, vol. 1822, pp. 60–73.
Woodham, R.J. 1980. Photometric method for determining surface orientation from multiple images. Optical Engineering, 19(1):139–144.