Optical and Quantum Electronics

, Volume 32, Issue 6, pp 899–908

Normalised analysis for the design of evanescent-wave sensors and its use for tolerance evaluation

Authors

  • V. Brioude
    • Laboratoire TSI, UMR 5516Université Jean Monnet
  • O. Parriaux
    • Laboratoire TSI, UMR 5516Université Jean Monnet
Article

DOI: 10.1023/A:1007030931823

Cite this article as:
Brioude, V. & Parriaux, O. Optical and Quantum Electronics (2000) 32: 899. doi:10.1023/A:1007030931823

Abstract

The conditions for the optimisation of any step index waveguide evanescent-wave sensor and for the manufacturing tolerances are given in the form of analytical and normalised expressions. The analysis is made for both TE and TM modes, in both cases where the measurand is homogeneously distributed in the cover, and where it is an ultrathin film on the waveguide-cover interface.

evanescent-waveoptical waveguidesensitivity analysissensors
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Copyright information

© Kluwer Academic Publishers 2000