Journal of Materials Science

, Volume 36, Issue 1, pp 263–267

Sizes correction on AFM images of nanometer spherical particles

  • De-Quan Yang
  • Yu-Qing Xiong
  • Yun Guo
  • Da-An Da
  • Wei-Gang Lu
Article

DOI: 10.1023/A:1004894532155

Cite this article as:
Yang, DQ., Xiong, YQ., Guo, Y. et al. Journal of Materials Science (2001) 36: 263. doi:10.1023/A:1004894532155

Abstract

Atomic Force Microscopy (AFM) is widely used in morphology characterization of materials on nanometer and sub-micron scales. However, distortions universally exist in AFM images due to geometrical interaction between the sample surface and the limited size tip. Correction factors for AFM images are given in the paper based on a simple mathematical model. The results reveal that the correction factors are related with the distribution of the particles (compacted or dispersed). The distortions can cause bigger images than the real sizes using commercial pyramidal tips and the distortions are deflation under certain conditions as well. The distortions of the images are affected by the shape of the AFM tip and circumstance of the particles. The results are compared the experimental data.

Copyright information

© Kluwer Academic Publishers 2001

Authors and Affiliations

  • De-Quan Yang
    • 1
  • Yu-Qing Xiong
    • 1
  • Yun Guo
    • 1
  • Da-An Da
    • 2
  • Wei-Gang Lu
    • 2
  1. 1.Laboratory of Applied Surface Physics, Lanzhou Institute of PhysicsChinese Academy of Space TechnologyLanzhouPeople's Republic of China
  2. 2.Department of ChemistryLanzhou UniversityLanzhoueople's Republic of China