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Soller slits automatic focusing method for multi-element fluorescence detector

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Abstract

In X-ray absorption fine structure (XAFS) experiments, Soller slits are widely used as filter devices in order to improve the signal to noise ratio. Performing high accuracy manual focusing operations is a time-consuming process; therefore, this work introduces an automatic focusing method for Soller slits in multi-element fluorescence detectors. This method establishes a relation model between the fluorescence intensity distribution and the coordinates of the fluorescence excitation point. According to this relation model, the actual coordinates of the fluorescence excitation point can be deduced from the detected fluorescence intensity distribution and used in focusing operations. This method has proven to be feasible in an XAFS experiment at the BL14W1 beamline of the Shanghai Synchrotron Radiation Facility.

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Authors and Affiliations

  1. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201204, China

    Ya-Yun Yang, Qian Gao, Song-Qi Gu, Hai-Sheng Yu, Rui-You Lu & Yu-Ying Huang

  2. University of Chinese Academy of Sciences, Beijing, 100049, China

    Ya-Yun Yang & Rui-You Lu

Authors
  1. Ya-Yun Yang
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  2. Qian Gao
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  3. Song-Qi Gu
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  4. Hai-Sheng Yu
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  5. Rui-You Lu
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  6. Yu-Ying Huang
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Corresponding author

Correspondence to Qian Gao.

Additional information

This work was supported by National Nature Science Foundation of China (No. 11175244).

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Yang, YY., Gao, Q., Gu, SQ. et al. Soller slits automatic focusing method for multi-element fluorescence detector. NUCL SCI TECH 27, 115 (2016). https://doi.org/10.1007/s41365-016-0105-7

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  • DOI: https://doi.org/10.1007/s41365-016-0105-7

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