Nano Research

, Volume 1, Issue 4, pp 273–291

Raman spectroscopy and imaging of graphene

Open AccessReview Article

DOI: 10.1007/s12274-008-8036-1

Cite this article as:
Ni, Z., Wang, Y., Yu, T. et al. Nano Res. (2008) 1: 273. doi:10.1007/s12274-008-8036-1

Abstract

Graphene has many unique properties that make it an ideal material for fundamental studies as well as for potential applications. Here we review recent results on the Raman spectroscopy and imaging of graphene. We show that Raman spectroscopy and imaging can be used as a quick and unambiguous method to determine the number of graphene layers. The strong Raman signal of single layer graphene compared to graphite is explained by an interference enhancement model. We have also studied the effect of substrates, the top layer deposition, the annealing process, as well as folding (stacking order) on the physical and electronic properties of graphene. Finally, Raman spectroscopy of epitaxial graphene grown on a SiC substrate is presented and strong compressive strain on epitaxial graphene is observed. The results presented here are highly relevant to the application of graphene in nano-electronic devices and help in developing a better understanding of the physical and electronic properties of graphene.

https://static-content.springer.com/image/art%3A10.1007%2Fs12274-008-8036-1/MediaObjects/12274_2008_8036_Fig1_HTML.jpg

Keywords

GrapheneRaman spectroscopy and imagingsubstrate effectdevice application
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Copyright information

© Tsinghua University Press and Springer-Verlag Berlin Heidelberg 2008

Authors and Affiliations

  • Zhenhua Ni
    • 1
  • Yingying Wang
    • 1
  • Ting Yu
    • 1
  • Zexiang Shen
    • 1
  1. 1.Division of Physics and Applied Physics, School of Physical and Mathematical SciencesNanyang Technological UniversitySingaporeSingapore