Nano Research

, Volume 1, Issue 4, pp 321–332

Imaging electronic structure of carbon nanotubes by voltage-contrast scanning electron microscopy

Authors

    • Institut für Nanotechnologie, Forschungszentrum Karlsruhe
  • Sabine Blatt
    • Institut für Nanotechnologie, Forschungszentrum Karlsruhe
    • Physikalisches InstitutUniversität Karlsruhe
  • Christoph Marquardt
    • Institut für Nanotechnologie, Forschungszentrum Karlsruhe
    • Physikalisches InstitutUniversität Karlsruhe
  • Simone Dehm
    • Institut für Nanotechnologie, Forschungszentrum Karlsruhe
  • Raghav Wahi
    • Institut für Nanotechnologie, Forschungszentrum Karlsruhe
  • Frank Hennrich
    • Institut für Nanotechnologie, Forschungszentrum Karlsruhe
    • Institut für Nanotechnologie, Forschungszentrum Karlsruhe
Open AccessResearch Article

DOI: 10.1007/s12274-008-8034-3

Cite this article as:
Vijayaraghavan, A., Blatt, S., Marquardt, C. et al. Nano Res. (2008) 1: 321. doi:10.1007/s12274-008-8034-3

Abstract

We introduce voltage-contrast scanning electron microscopy (VC-SEM) for visual characterization of the electronic properties of single-walled carbon nanotubes. VC-SEM involves tuning the electronic band structure and imaging the potential profi le along the length of the nanotube. The resultant secondary electron contrast allows to distinguish between metallic and semiconducting carbon nanotubes and to follow the switching of semiconducting nanotube devices, as confi rmed by in situ electrical transport measurements. We demonstrate that high-density arrays of individual nanotube devices can be rapidly and simultaneously characterized. A leakage current model in combination with fi nite element simulations of the device electrostatics is presented in order to explain the observed contrast evolution of the nanotube and surface electrodes. This work serves to fill a void in electronic characterization of molecular device architectures.

https://static-content.springer.com/image/art%3A10.1007%2Fs12274-008-8034-3/MediaObjects/12274_2008_8034_Fig1_HTML.jpg

Keywords

Carbon nanotubes electronic properties voltage-contrast scanning electron microscopy electrostatics

Supplementary material

12274_2008_8034_MOESM1_ESM.pdf (1.3 mb)
Supplementary material, approximately 1.28 MB.
12274_2008_8034_MOESM1_ESM.zip (14.8 mb)
Supplementary material, approximately 14.7 MB.

Copyright information

© Tsinghua University Press and Springer-Verlag Berlin Heidelberg 2008